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Impact of Growth Kinetics on the Interface Morphology and Magnetization in La1/3Sr2/3FeO3/La2/3Sr1/3MnO3 Heterostructures

M. Waschk,A. Sarkar,J. Barthel,J. Voigt, S. Schroeder,P. Zakalek,M. Schmitz,B. J. Kirby,S. Puetter,J. Schubert,T. Brueckel

Journal of Physics Condensed Matter（2020）

Cited 1|Views37
Key words
magnetic depth profile,exchange bias,polarized neutron reflectivity,growth kinetics,interface diffusion,thin film heterostructure,epitaxy
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