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Low frequency noise characterization and modeling of SiGe HBT featuring LASER annealing in a 55-nm CMOS node

J. Elbeyrouthy,A. Vauthelin,B. Sagnes,F. Pascal,A. Hoffmann,M. Valenza,S. Haendler,Alexis Gauthier,Pascal Chevalier,D. Gloria

international conference on noise and fluctuations（2019）

Cited 0|Views47
Key words
sige hbt,low frequency noise characterization
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