Chrome Extension
WeChat Mini Program
Use on ChatGLM
VIPCreated with Sketch.

In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory.

B. L. Ji,H. Li, Q. Ye,S. Gausepohl,S. Deora,D. Veksler,S. Vivekanand,H. Chong,H. Stamper, T. Burroughs, C. Johnson, M. Smalley,S. Bennett,V. Kaushik,J. Piccirillo,M. Rodgers, M. Passaro,M. Liehr

Memory Workshop（2015）

Cited 6|Views5
Key words
nonvolatile memory,RRAM,variability analysis,manufacturing in-line-test,bit error rate
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined