Scaling Aspects of Nanowire Schottky Junction Based Reconfigurable Field Effect Transistors
2019 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS)（2019）
Key words
scaling,screening length,nanowire,Schottky junction,SBFET,reconfigurable logic,RFET,tunneling,simulation,TCAD
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