VPLNet: Deep Single View Normal Estimation with Vanishing Points and Lines
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)（2020）
关键词
vanishing point analysis,deep learning approach,color image,Manhattan line map,deep neural network,dense normal map,dense Manhattan label map,planar regions,fully differentiable manner,Manhattan part,nonManhattan part,discrete classification,direct supervision,surface normal network,depth estimation networks,single-view surface normal estimation method
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