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Location-Specific Microstructure Characterization Within IN625 Additive Manufacturing Benchmark Test Artifacts

M. R. Stoudt,M. E. Williams,L. E. Levine,A. Creuziger, S. A. Young,J. C. Heigel,B. M. Lane,T. Q. Phan

Integrating materials and manufacturing innovation（2020）

Cited 31|Views23
Key words
Additive manufacturing,Benchmarks,Model validation,AM-Bench,Microstructure
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