Anodized Titanium Oxide Thickness Estimation with Ellipsometry, Reflectance Spectra Extrema Positions and Electronic Imaging: Importance of the Interfaces Electromagnetic Phase-Shift
Thin Solid Films（2020）
关键词
titanium anodizing,oxide thickness determination,interference phenomenon,ellipsometry,Focused Ion Beam lamellae,reflectance spectrum,electromagnetic phase-shift
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