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Compact Model of Read Disturbance by Hot Carrier Injection in 3D NAND Flash Memory

Jaeyeol Park,Dokyun Son, Minsoo Kim,Hyungjun Jo,Hyungcheol Shin

2020 4th IEEE Electron Devices Technology &amp Manufacturing Conference (EDTM)（2020）

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Key words
3D NAND Flash Memory,Read disturbance,Hot carrier injection current model
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