Technique for Measuring of LIA Spot Size on Target by X-rays Propagating in Beam Backward Direction

P. A. Kolesnikov,V. Yu Politov, E. S. Li, A. P. Yaskevich, S. A. Kolesnikov, Yu M. Ekimov, M. A. Malyshev,A. R. Akhmetov, D. Petrov,O. A. Nikitin, I. Penzin,Yu A. Trunev,M. G. Atlukhanov,A. Burdakov,V. V. Danilov,V. V. Kurkuchekov,S. S. Popov,D. Skovorodin,K. Zhivankov

JOURNAL OF INSTRUMENTATION（2020）

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关键词

Beam-line instrumentation (beam position and profile monitors,beam-intensity monitors,bunch length monitors),Instrumentation for particle accelerators and storage rings - high energy (linear accelerators, synchrotrons),Accelerator Applications

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