Single-Event Upsets in a 7-Nm Bulk FinFET Technology with Analysis of Threshold Voltage Dependence
IEEE Transactions on Nuclear Science（2021）
Key words
Threshold voltage,FinFETs,Delays,Shift registers,Ions,Integrated circuit modeling,Transistors,Alpha particles,critical charge,cross sections,FinFETs,flip-flops (FFs),heavy ions,radiation effects,single-event upset (SEU),supply voltage,threshold voltage
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