Energy-Resolved Soft-Error Rate Measurements for 1–800 MeV Neutrons by the Time-of-Flight Technique at LANSCE
IEEE transactions on nuclear science（2020）
Key words
Neutrons,Field programmable gate arrays,Semiconductor device measurement,Registers,Energy measurement,Random access memory,Semiconductor devices,Field-programmable gate arrays (FPGAs),neutron radiation effects,particle accelerator,single-event upset (SEU) cross section,time-of-flight (TOF) technique
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