Off-state TDDB in FinFET Technology and Its Implication for Safe Operating Area
IEEE International Reliability Physics Symposium（2021）
关键词
off-state stress,reliability,safe operating area (SOA),time dependent dielectric breakdown (TDDB)
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要