Chrome Extension
WeChat Mini Program
Use on ChatGLM
VIPCreated with Sketch.

Single Event Upset Evaluation for a 28-Nm FDSOI SRAM Type Buffer in an ARM Processor

China Institute of Atomic Energy,Chen Rui,Liu Rui,Chen Mo,Shen Chen,Li Xuantian,Tian Haonan,Chen Li

Journal of Electronic Testing（2021）

Cited 1|Views18
Key words
SEU,SRAM,FDSOI,TMR,MCU
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined