A System-Level Modeling Approach for Simulating Radiation Effects in Successive-Approximation Analog-to-Digital Converters

M. W. Rony,En Xia Zhang,Mahmud Reaz,Kan Li,Andrew Daniel,Bernard Rax,Philippe Adell,Jeffrey Kauppila,Gabor Karsai,Tim Holman,Robert A. Reed,Arthur Witulski,Ronald D. Schrimpf

IEEE Transactions on Nuclear Science（2021）

Cited 2|Views52

Key words

Calibration,Degradation,Integrated circuit modeling,Transfer functions,Data models,Computational modeling,Analog-digital conversion,Analog-to-digital converter (ADC),behavioral model,Eldo,Questa platform,successive-approximation-register (SAR),total ionizing dose (TID),Verilog-AMS

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