Unsupervised Learning Approaches to Characterizing Heterogeneous Samples Using X-ray Single-Particle Imaging
Yulong Zhuang,Salah Awel,Anton Barty,Richard Bean,Johan Bielecki,Martin Bergemann,Benedikt J. Daurer,Tomas Ekeberg,Armando D. Estillore,Hans Fangohr,Klaus Giewekemeyer,Mark S. Hunter,Mikhail Karnevskiy,Richard A. Kirian,Henry Kirkwood,Yoonhee Kim,Jayanath Koliyadu,Holger Lange,Romain Letrun,Jannik Luebke,Abhishek Mall,Thomas Michelat,Andrew J. Morgan,Nils Roth,Amit K. Samanta,Tokushi Sato,Zhou Shen,Marcin Sikorski,Florian Schulz,John C. H. Spence,Patrik Vagovic,Tamme Wollweber,Lena Worbs,P. Lourdu Xavier,Oleksandr Yefanov,Filipe R. N. C. Maia,Daniel A. Horke,Jochen Kuepper,N. Duane Loh,Adrian P. Mancuso,Henry N. Chapman,Kartik Ayyer IUCrJ（2022）
Key words
coherent X-ray diffractive imaging (CXDI),single particles,XFELs
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