Comparison of Deep Learning-Based Image Segmentation Methods for the Detection of Voids in X-ray Images of Microelectronic Components
2021 IEEE 17TH INTERNATIONAL CONFERENCE ON AUTOMATION SCIENCE AND ENGINEERING (CASE)（2021）
关键词
deep learning-based image segmentation methods,X-ray images,microelectronic components,instance segmentation,solder void detection,void segmentation,failure analysis,convolutional neural networks,void pixels,semantic segmentation,Mask-RCNN,simple binary mask,overlapping void area,computer vision methods,U-Net
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