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Wire-cell 3D Pattern Recognition Techniques for Neutrino Event Reconstruction in Large LArTPCs: Algorithm Description and Quantitative Evaluation with MicroBooNE Simulation

P. Abratenko,R. An,J. Anthony,L. Arellano,J. Asaadi,A. Ashkenazi,S. Balasubramanian,B. Baller,C. Barnes,G. Barr,V Basque,L. Bathe-Peters,O. Benevides Rodrigues,S. Berkman,A. Bhanderi,A. Bhat,M. Bishai,A. Blake,T. Bolton,J. Y. Book,L. Camilleri,D. Caratelli, I. Caro Terrazas,R. Castillo Fernandez,F. Cavanna,G. Cerati,Y. Chen,D. Cianci,J. M. Conrad,M. Convery,L. Cooper-Troendle,J. Crespo-Anadon,M. Del Tutto,S. R. Dennis,P. Detje,A. Devitt,R. Diurba,R. Dorrill,K. Duffy,S. Dytman,B. Eberly,A. Ereditato,J. J. Evans,R. Fine,G. A. Fiorentini Aguirre, R. S. Fitzpatrick,B. T. Fleming,N. Foppiani,D. Franco,A. P. Furmanski,D. Garcia-Gamez,S. Gardiner,G. Ge,S. Gollapinni,O. Goodwin,E. Gramellini,P. Green,H. Greenlee,W. Gu,R. Guenette,P. Guzowski,L. Hagaman,O. Hen,C. Hilgenberg,G. A. Horton-Smith,A. Hourlier,R. Itay,C. James,X. Ji,L. Jiang,J. H. Jo,R. A. Johnson,Y-J Jwa,D. Kalra,N. Kamp,N. Kaneshige,G. Karagiorgi,W. Ketchum,M. Kirby,T. Kobilarcik,I Kreslo,R. LaZur,I Lepetic,K. Li,Y. Li,K. Lin,B. R. Littlejohn,W. C. Louis,X. Luo,K. Manivannan,C. Mariani,D. Marsden,J. Marshall,D. A. Martinez Caicedo,K. Mason,A. Mastbaum,N. McConkey,V Meddage,T. Mettler,K. Miller,J. Mills,K. Mistry, A. Mogan,T. Mohayai,J. Moon,M. Mooney,A. F. Moor,C. D. Moore,L. Mora Lepin,J. Mousseau,M. Murphy,D. Naples,A. Navrer-Agasson,M. Nebot-Guinot,R. K. Neely,D. A. Newmark,J. Nowak,M. Nunes,O. Palamara,V Paolone,A. Papadopoulou,V Papavassiliou,S. F. Pate,N. Patel,A. Paudel,Z. Pavlovic,E. Piasetzky,I. D. Ponce-Pinto,S. Prince,X. Qian,J. L. Raaf,V Radeka,A. Rafique,M. Reggiani-Guzzo,L. Ren, L. C. J. Rice,L. Rochester,J. Rodriguez Rondon,M. Rosenberg,M. Ross-Lonergan,G. Scanavini,D. W. Schmitz,A. Schukraft,W. Seligman,M. H. Shaevitz, R. Sharankova,J. Shi,J. Sinclair, A. Smith,E. L. Snider,M. Soderberg,S. Soldner-Rembold,P. Spentzouris,J. Spitz,M. Stancari,J. St John,T. Strauss,K. Sutton,S. Sword-Fehlberg,A. M. Szelc,N. Tagg,W. Tang,K. Terao,C. Thorpe,D. Totani,M. Toups,Y-T Tsai,M. A. Uchida,T. Usher,W. Van De Pontseele,B. Viren,M. Weber,H. Wei,Z. Williams,S. Wolbers,T. Wongjirad,M. Wospakrik,K. Wresilo, N. Wright,W. Wu,E. Yandel,T. Yang,G. Yarbrough,L. E. Yates,H. W. Yu,G. P. Zeller,J. Zennamo,C. Zhang

Journal of instrumentation（2022）

Cited 13|Views61
Key words
Pattern recognition, cluster finding, calibration and fitting methods,Analysis and statistical methods
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