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TCAD Simulation and Primary Experimental Investigations on the Performance of the 3D Si SOI PN Array Microdosimeters

Yixian Guo,Shuhuan Liu, Zhuqi Li, Long Li,Yong Ma, Ning Han,Zheng Li

2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)(2021)

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Key words
Si SOI array microdosimeter,Charge collection,Leakage current,Radiation damage
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