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Trace-element XAFS Sensitivity: a Stress Test for a New XRF Multi-Detector.

Ilaria Carlomagno,Matias Antonelli,Giuliana Aquilanti,Pierluigi Bellutti,Giuseppe Bertuccio,Giacomo Borghi,Giuseppe Cautero,Daniela Cirrincione,Giovanni de Giudici,Francesco Ficorella,Massimo Gandola,Dario Giuressi,Daniela Medas,Filippo Mele,Ralf H. Menk,Luca Olivi,Giulio Orzan,Antonino Picciotto,Francesca Podda,Alexandre Rachevski,Irina Rashevskaya,Luigi Stebel,Andrea Vacchi,Gianluigi Zampa,Nicola Zampa,Nicola Zorzi,Carlo Meneghini

Journal of Synchrotron Radiation（2021）

引用 6|浏览42
关键词
X-ray fluorescence,fluorescence detector,X-ray absorption spectroscopy,geology
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