Using Long Short-Term Memory (LSTM) Network to Predict Negative-Bias Temperature Instability
2021 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2021)（2021）
关键词
Degradation,Long Short-Term Memory (LSTM),Negative-Bias Temperature Instability (NBTI),Reliability,Technology Computer-Aided Design (TCAD)
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