(Invited) Nanoscale Investigation of Extended Defects in Wide Bandgap Semiconductors by Exploiting Phonon-Resonant Near-Field Interaction
Enhanced Spectroscopies and Nanoimaging 2020（2020）
关键词
Nanophotonics,Near-Field Optical Microscopy,Microsphere-Assisted Techniques,Nanoscale Optical Manipulation,Nanoprobing
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