A New Surface Potential and Physics Based Compact Model for A-Igzo TFTs at Multinanoscale for High Retention and Low-Power DRAM Application
2021 IEEE International Electron Devices Meeting (IEDM)（2021）
关键词
Solid modeling,Analytical models,Logic gates,Predictive models,Capacitance,Data models,Threshold voltage
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要