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Linear Growth of Reaction Layer During In-Situ TEM Annealing of Thin Film Al/Ni Diffusion Couples

A. Kostka,D. Naujoks,T. Oellers,S. Salomon,C. Somsen, E. oeztuerk,A. Savan,A. Ludwig,G. Eggeler

Journal of Alloys and Compounds（2022）

Cited 6|Views11
Key words
Thin film,Interdiffusion,Diffusion growth,Growth kinetics,In situ transmission electron microscopy,(TEM),XRD
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