A Thermal Quorum Sensing Scheme for Enhancement of Integrated-Circuit Reliability and Lifetime
2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)（2022）
关键词
Temperature sensors,Symbiosis,Correlation,Voltage,Hardware,Semiconductor process modeling,Reliability
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要