Static and Dynamic Performance of Charge-Carrier Lifetime-Tailored High-Voltage SiC P-I-n Diodes with Capacitively Assisted Switching
IEEE Transactions on Power Electronics（2022）
Key words
Charge carrier lifetime,Silicon carbide,Semiconductor diodes,Carbon,Silicon,Loss measurement,Switches,Charge-carrier lifetime,converters,power semiconductor diodes,rectifiers,resonant power conversion,semiconductor device testing,silicon carbide (SiC)
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