Probing the Single-Event Sensitivity of a COTS 3D-Integrated Imager with Alpha Particle Irradiation
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2023）
关键词
Alpha particles,Standards,Random access memory,Radiation effects,Indexes,Image color analysis,Transform coding,3D-integrated circuit (IC),alpha particle irradiation,CMOS image sensor (CIS),commercial off-the-shelf (COTS),radiation effects,single-event effect (SEE),single-event latchup (SEL),single-event transient (SET),single-event upset (SEU),stacked IC
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