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Numerical Analysis of an Ultralow Switching Loss IGBT with an Inner Primary Blocking Junction

IEEE TRANSACTIONS ON ELECTRON DEVICES(2023)

Cited 4|Views18
Key words
Insulated gate bipolar transistors,Junctions,Voltage,Logic gates,Switching loss,Electromagnetic interference,Transistors,Electric field (E-field),electromagnetic interference (EMI) noise,insulated gate bipolar transistor (IGBT),turn-off loss,turn-on loss
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