Extracting Total Ionizing Dose Threshold Voltage Shifts from Ring Oscillator Circuit Response

Lawrence T. Clark,Clifford S. Young-Sciortino,Steven M. Guertin,William E. Brown,Keith E. Holbert,Phaneendra Bikkina, Sumukh Bhanushali,Andrew Levy,Marek Turowski,Jim D. Butler

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY（2023）

引用 1|浏览26

关键词

Logic gates,Transistors,Silicon-on-insulator,Threshold voltage,Standards,Radiation effects,Electrostatic discharges,Total ionizing dose,silicon on insulator,reliability assessment

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