In Situ Device-Level TEM Characterization Based on Ultra-Flexible Multilayer MoS2 Micro-Cantilever
ADVANCED MATERIALS（2023）
Key words
in situ device-level transmission electron microscopy characterization,molybdenum disulfide transistors,nanorobotic manipulation,opto-electromechanical transmission electron microscopy system,ultra-flexible micro-cantilevers
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