Quantitative Analysis of Multipactor Threshold Sensitivity to Secondary Emission Yield of Microwave DevicesShu Lin,Hao Qu,Ning Xia,Patrick Wong,Peng Zhang,John Verboncoeur,Meng Cao,Yonggui Zhai,Yongdong Li,Hongguang WangPhysics of Plasmas（2023）引用 3|浏览23AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
