Fidelity of Counting the Transferred Electrons in a GaAs-based Monolithic Single-Electron Pump and Transistor System with a Charge-Lock Feedback Circuit

Young-Seok Ghee,Bum-Kyu Kim,Suk-In Park,Jindong Song,Wan-Seop Kim,Myung-Ho Bae,Nam Kim

APPLIED PHYSICS LETTERS（2023）

Korea Res Inst Stand & Sci

Cited 1|Views33

Abstract

We developed an electron-counting technique for a self-referenced single-electron quantized current source of a single-electron-pump system and investigated the fidelity of our whole measurement process, including single-electron pumping and electron counting by a single-electron transistor (SET) with a charge-lock feedback loop. The device was fabricated monolithically using a two-dimensional electron system of a GaAs/AlGaAs hetero-junction. In addition to the probability of single-electron transfer, we also measured the current noise spectrum of the SET, from which its charge noise power Sq was derived. The results show that the estimated charge noise of 2.2 ×10−4 e/Hz for a semiconductor-based SET is comparable to that of metallic SETs.

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【要点】：本文提出了一种基于GaAs/AlGaAs异质结二维电子系统的单电子泵系统，并使用单电子晶体管（SET）与电荷锁定反馈回路实现了高保真度的电子计数技术。

【方法】：研究利用单电子泵系统和SET的电子计数技术，通过电荷锁定反馈环来提高测量过程的保真度。

【实验】：实验在单电子泵系统中进行，使用SET进行电子计数，并测量了SET的电流噪声谱，从电荷噪声功率Sq得出结果，实验数据集名称未提及，但设备是采用GaAs/AlGaAs异质结技术单片集成制造的。实验结果显示，基于半导体的SET电荷噪声为2.2 ×10−4 e/Hz，与金属SET相当。