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Characterization of Near-Field Emission and Structure of an Sld by Polarization Parametric Indirect Microscopic Imaging

Bin Ni,Wei Chen,Shengwei Ye,Lu Xue,Lianping Hou,John H. Marsh,Kai Gu,Chaofu Sun,Xuefeng Liu,Jichuan Xiong

Journal of Physics D Applied Physics（2023）

Cited 0|Views19
Key words
superluminescent diode (SLD),polarization parametric indirect microscopic imaging (PIMI),end-face structure,near-field spot
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