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Light-YOLOv5: A Lightweight Algorithm for Improved YOLOv5 in PCB Defect Detection

Meng Ye,Hao Wang, Hang Xiao

2023 IEEE 2nd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA)(2023)

引用 7|浏览1
关键词
Industrial Defect Detection,Slimneck,Attention mechanism,YOLOv5
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