Light-YOLOv5: A Lightweight Algorithm for Improved YOLOv5 in PCB Defect Detection
2023 IEEE 2nd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA)(2023)
关键词
Industrial Defect Detection,Slimneck,Attention mechanism,YOLOv5
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要