Neutron Displacement Damage Cross Section in GaN: Numerical Evaluations and Differences with Si

Damien Lambert, Julien Parize,Nicolas Richard,Melanie Raine,Olivier Duhamel,Claude Marcandella,Arthur Losquin,Anne Hemeryck,Christophe Inguimbert,Philippe Paillet

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2023）

引用 3|浏览31

关键词

Neutrons,Silicon,Databases,Ions,Monte Carlo methods,Gallium,Uncertainty,Cross section,displacement damage,GaN,Geant4,Monte Carlo neutron,nonionizing energy loss (NIEL),total nonionizing dose (TNID)

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