Single-Quantum Measurement with a Multiple-Amplifier Sensing Charge-Coupled Device

Ana M. Botti,Brenda A. Cervantes-Vergara,Claudio R. Chavez,Fernando Chierchie,Alex Drlica-Wagner,Juan Estrada,Guillermo Fernandez Moroni,Stephen E. Holland, Blas Junior Irigoyen Gimenez,Agustin J. Lapi,Edgar Marrufo Villalpando,Miguel Sofo Haro,Javier Tiffenberg,Sho Uemura

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

Cited 7|Views64

Key words

Charge coupled devices,Sensors,Noise,Registers,Charge measurement,Noise measurement,Semiconductor device measurement,Charge-coupled device (CCD),multiple-amplifier sensing CCD (MAS-CCD),multiple distributed amplifiers,nondestructive readout sensor,single-electron resolution imager,single-photon counting imager

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