Effect of Resistance Variability in Vector Matrix Multiplication Operations of 1T1R ReRAM Crossbar Arrays Using an Embedded Test Platform
2023 IEEE 32ND MICROELECTRONICS DESIGN & TEST SYMPOSIUM, MDTS（2023）
Key words
Microcontroller,Low resistive state (LRS),High resistive state (HRS),PCB,memory,Vector Math operations (VMM),In-memory computing (IMC)
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