Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Francesco Lorenzelli,Asser Elsayed,Clement Godfrin,Alexander Grill,Stefan Kubicek,Ruoyu Li,Michele Stucchi,Danny Wan,Kristiaan De Greve,Erik Jan Marinissen,Georges Gielen

2023 IEEE EUROPEAN TEST SYMPOSIUM, ETS（2023）

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关键词

classical computers,cryogenic temperature testing,dilution refrigerator,fault-tolerant quantum computer,high-volume room-temperature screening,MOS Si spin qubit arrays,parametric test routine,quantum computers,room-temperature data,Si spin qubits,silicon spin qubit applications,single-electron transistors,single-electron transistors,transistor metrics

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