Reliability Modeling of Mutual DCFP Considering Failure Physical Dependency
Journal of Systems Engineering and Electronics（2023）
Key words
Degradation,Couplings,Monte Carlo methods,Correlation,Electric shock,Failure analysis,Reliability theory,electronic system,dependent competing failure process (DCFP),failure physical dependency,threshold descent model,competition failure modes
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined