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Leaf Area Index Estimation under Wheat Powdery Mildew Stress by Integrating UAV‑based Spectral, Textural and Structural Features

Yang Liu,Lulu An,Nan Wang,Weijie Tang, Minjia Liu, Gouhui Liu,Hong Sun,Minzan Li,Yuntao Ma

COMPUTERS AND ELECTRONICS IN AGRICULTURE（2023）

Cited 21|Views34
Key words
Winter wheat,Powdery mildew,UAV,Multispectral images,LAI,DI
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