Unexpected Field Evaporation Sequence in Γ-Tial

In atom probe tomography (APT), atoms from the surface of a needle shape specimen are evaporated under a high electric field and analyzed via time of flight mass spectrometry and position sensitive detection. 3D reconstruction of the atom positions follows a simple projection law, which can sometimes lead to artifacts due to deviation from an assumed ideal evaporation sequence. Here, we revisit the evaporation behavior of [001]-oriented γ-TiAl using a full-dynamics simulation approach empowered by molecular dynamics. Without any knowledge of charge states or assumptions about evaporation fields, we successfully reproduced the lack of distinct Al and Ti layers observed in reconstructions of experimental data which is traditionally attributed to the retention of Al on the evaporating surface. We further showed that a step-wise bond breaking process of Ti in contrast to the simultaneous bond breaking of Al explains the seemingly counterintuitive preferential evaporation of the strongly bonded Ti atoms.