174 Osにおける2 1 + 状態の異常に大きい遷移強度の寿命測定による研究

C B Li, Xiao Wu,X F Li,Chun He,Y. Zheng, G S Li, P. W. Luo,S. P. Hu, H W Li,J L Wang, J. J. Liu,C. F. Xu, Ji Sun, Wei Wu

Physical review C（2012）

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