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Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells

Van T. N. Mai, Văn Hùng Nguyễn,Pascale Auban Senzier,Claude Pasquier,Kang Wang,Marcelo Rozenberg,J. Giapintzakis,Evripides Kyriakides,Thomas Maroutian,Guillaume Agnus,Philippe Lecoeur, Ngoc Duy Nguyen,Sami Oukassi,Raphaël Salot,David Alamarguy,Pascal Chrétien, Jean Lacroix,Olivier Schneegans

HAL (Le Centre pour la Communication Scientifique Directe)（2021）

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关键词
write/erase endurance measurements,extended write/erase,afm-based
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