A Compact Double-Exponential Circuit for Single Event Transient Emulation

Sebastia A. Bota,Salvador Barcelo,Gabriel Torrens,Rafel Perello,Jaume Verd,Ivan de Paul,Jaume Segura

2023 38TH CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS, DCIS（2023）

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关键词

Soft errors,single event transient,single event upset,critical charge estimation,integrated circuit design,radiation hardening,electrical simulation,CMOS

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