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A Multiple Instance Learning Approach to Study Leaf Wilt in Soybean Plants

Sanjana Banerjee, Paula Ramos,Chris Reberg-Horton, Steven Mirsky,Anna Locke,Edgar Lobaton

Agriculture(2025)

Cited 0|Views0
Key words
deep learning,computer vision,precision agriculture,remote sensing,soybean cultivation,drought stress,multi-class classification
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