Study of GaN HEMTs Robustness to Application-Like, Software-Controlled Overshoots Emulating Different Gate Routings in Original 50 Ohms Environment
2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)（2023）
关键词
GaN,Overshoot,Transient,Spike,Deported Control,50 Ohm Environment,Robustness,characterization
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