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Correlation of H- Beam Properties to Cs-coverage

J. Lettry,A. Vnuchenko,S. Bertolo,C. Mastrostefano,M. O'Neil,F. di Lorenzo,Y. Coutron, D. Steyeart,B. Riffaud, J. Thiboud,R. Guida,K. Kapusniak, C. Charvet,B. Teissandier,P. Moyret,F. Roncarolo,S. Bart Pedersen,M. Duraffourg,C. Vuitton, S. Joffe, C. Machado,U. Fantz,S. Mochalskyy,D. Wunderlich,M. Lindqvist,N. den Harder,S. Briefi,A. Hurlbatt,T. Kalvas,T. Minea,A. Revel

JOURNAL OF INSTRUMENTATION（2023）

Cited 1|Views29
Key words
Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS)),Accelerator Applications
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