A Method to Neutralize the Impact of DVS on the Reliability of COTS SRAMs with ECC by Using Periodic Scrubbing
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2023）
Key words
Voltage control,Neutrons,Sensitivity,Protons,Voltage,Error correction codes,Power demand,Commercialization,Software packages,Radiation hardening (electronics),Single event transients,Random access memory,Commercial-off-the-shelf (COTS),dynamic voltage scaling (DVS),radiation hardness,reliability,scrubbing,single event effect (SEE) sensitivity,soft error,static random access memory (SRAM)
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