New Particle-Induced Single Event Latchup Mechanism Observed in a Cryogenic CMOS Readout Integrated CircuitCheryl J. Marshall,Paul W. Marshall,Ray Ladbury,Augustyn Waczynski,Roger Foltz,Rajan Arora,Nathaniel A. Dodds,John D. Cressler,Jonathan A. Pellish,Dakai Chen,Duncan M. Kahle, Gregory Delo,Emily Kan,Nicholas Boehm,Robert A. Reed,Kenneth A. LaBelsemanticscholar引用 0|浏览1AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
