TCAD Calibrated SEE Fault Model Validated with Beam Results for a 12nm D Flip-Flop.
2022 22ND EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, RADECS（2022）
关键词
Cross-section,FinFET,modeling,single event effects,single event upset,technology CAD
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要