Analysis of Efficiency and Utilization with SRAM Dosimetry for Single-Event Effect Evaluation under Irradiation

Seungjoo Woo, Raehwan Yoon,Dongwoo Bae,Kiseog Kim,Hyeokjae Lee,Sung S. Chung,Changhee Cho, Jeongsoo Kim,Stephen A. Wender,Youngboo Kim

2022 22ND EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS, RADECS（2022）

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quantitative correction factor (Qcrit_eff) ratio,dosimeter,single event effects (SEE),single event upset (SEU),static random access memory (SRAM),SiC power diode

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